A high temperature capacitance dilatometer is shown here mounted
on a differential micrometer for calibration purposes. The dilatometer
(stage 1) has resolution better than 1 Angstrom (10-10 m), the
micrometer (stage 2) has a resolution of .0005 mm (5 10-7 m), while the
coarse adjustment (stage 3) has a resolution of 0.01 mm (10-5 m). The
itself is linear over a range of 0.3 mm, i.e. over five orders of
of its resolution. It offers users the opportunity, for the first time,
to make measurements of changes of length or position with Angstrom
at temperatures up to 1500 degrees Celsius with a small compact sensor
which is located at the sample position and at the sample temperature.
Genossar and M. O. Steinitz 1990 "A Tilted Plate Capacitance
Sci. Instrum. 61, 2469-2471.